A calibration-free 3V 16b 500kS/s 6mW 0.5mm² ADC with 0.13 μm CMOS Export

@inproceedings{citeulike:3857925, abstract = {A calibration-free 3V 6mW 16-bit 500kS/s cyclic ADC with an active die area of 0.5mm² is implemented in a 0.13 μm CMOS. The proposed converter adopts a 2.5-bit/stage cyclic architecture and capacitor layout scheme to achieve improved matching accuracy, the DNL and INL of ±0.90 LSB and ±6.1 LSB, respectively.}, author = {Choi, Hee-Cheol and You, Seung-Bin and Lee, Ho-Young and Park, Ho-Jin and Kim, Jae-Whui}, booktitle = {VLSI Circuits, 2004. Digest of Technical Papers. 2004 Symposium on}, citeulike-article-id = {3857925}, citeulike-linkout-0 = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=1346509}, comment = {This could be used to sample 25 sensors at a rate of 20kHz in an FFT array system. 100 sensors would take 2mm^2}, journal = {VLSI Circuits, 2004. Digest of Technical Papers. 2004 Symposium on}, keywords = {adc, fft}, pages = {76--77}, posted-at = {2009-01-07 18:31:17}, priority = {0}, title = {A calibration-free 3V 16b 500kS/s 6mW 0.5mm² ADC with 0.13 μm CMOS}, url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=1346509}, year = {2004} }

TY - CONF ID - citeulike:3857925 L3 - citeulike-article-id:3857925 N2 - A calibration-free 3V 6mW 16-bit 500kS/s cyclic ADC with an active die area of 0.5mm² is implemented in a 0.13 μm CMOS. The proposed converter adopts a 2.5-bit/stage cyclic architecture and capacitor layout scheme to achieve improved matching accuracy, the DNL and INL of ±0.90 LSB and ±6.1 LSB, respectively. JF - VLSI Circuits, 2004. Digest of Technical Papers. 2004 Symposium on EP - 77 TI - A calibration-free 3V 16b 500kS/s 6mW 0.5mm² ADC with 0.13 μm CMOS T2 - VLSI Circuits, 2004. Digest of Technical Papers. 2004 Symposium on SP - 76 KW - adc KW - fft N1 - This could be used to sample 25 sensors at a rate of 20kHz in an FFT array system. 100 sensors would take 2mm^2 AU - Choi, Hee-Cheol AU - You, Seung-Bin AU - Lee, Ho-Young AU - Park, Ho-Jin AU - Kim, Jae-Whui PY - 2004/// UR - http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=1346509 ER -