Enhancement of evanescent field pressure on a transparent film by coupling to surface plasmons Export

@article{citeulike:1552574, abstract = {We investigate theoretically the optical pressure exerted on a dielectric film by the surface plasmon-coupled evanescent fields that are generated in a multilayer system with a thin metal film by a p-polarized plane electromagnetic wave. We show that the evanescent field pressure dissappears by coupling to resonant waveguide modes in the sample film but the pressure can be strongly enhanced by coupling to surface plasmons on the metal film.}, address = {Department of Physics, Korea Adv. Inst. Sci. and Technol., 373-1 Kusongdong, Taejon, South Korea}, author = {Man, B. M. and Chang, S. and Lee, S. S.}, citeulike-article-id = {1552574}, citeulike-linkout-0 = {http://www.scopus.com/record/display.url?view=extended&origin=resultslist&eid=2-s2.0-0342626664}, journal = {Optik (Jena)}, keywords = {enhancement, evanescent, films, pressure, spr, tir, tirf, totalinternalreflection}, number = {11}, pages = {521--525}, posted-at = {2007-08-10 22:44:18}, priority = {4}, publisher = {Wissenschaftliche Verlagsgesellschaft}, title = {Enhancement of evanescent field pressure on a transparent film by coupling to surface plasmons}, url = {http://www.scopus.com/record/display.url?view=extended&origin=resultslist&eid=2-s2.0-0342626664}, volume = {110}, year = {1999} }

TY - JOUR ID - citeulike:1552574 L3 - citeulike-article-id:1552574 N2 - We investigate theoretically the optical pressure exerted on a dielectric film by the surface plasmon-coupled evanescent fields that are generated in a multilayer system with a thin metal film by a p-polarized plane electromagnetic wave. We show that the evanescent field pressure dissappears by coupling to resonant waveguide modes in the sample film but the pressure can be strongly enhanced by coupling to surface plasmons on the metal film. IS - 11 JF - Optik (Jena) AD - Department of Physics, Korea Adv. Inst. Sci. and Technol., 373-1 Kusongdong, Taejon, South Korea EP - 525 TI - Enhancement of evanescent field pressure on a transparent film by coupling to surface plasmons PB - Wissenschaftliche Verlagsgesellschaft VL - 110 SP - 521 KW - enhancement KW - evanescent KW - films KW - pressure KW - spr KW - tir KW - tirf KW - totalinternalreflection AU - Man, BM AU - Chang, S AU - Lee, SS PY - 1999/// UR - http://www.scopus.com/record/display.url?view=extended&origin=resultslist&eid=2-s2.0-0342626664 ER -