Measurement of absolute particle-surface separation using total internal reflection microscopy and radiation pressure forces Export

@article{citeulike:2160212, abstract = {We have previously show how total internal reflection microscopy and radiation pressure forces can be used to study weak interactions between particles and surfaces. The work described here illustrates how we have improved the experiment and extended the technique to measure absolute particle-surface separations as a function of NaCl electrolyte concentration. In so doing, we have shown how the dynamics of particles moving orthogonal to a plane surface can be studied. {\copyright} 1990 American Chemical Society.}, address = {Unilever Research, Port Sunlight Laboratory, Quarry Road East, Bebington, Wirral, Merseyside L63 3JW, United Kingdom}, author = {Brown, M. A. and Staples, E. J.}, citeulike-article-id = {2160212}, citeulike-linkout-0 = {http://www.scopus.com/record/display.url?view=extended&origin=resultslist&eid=2-s2.0-0001364472}, journal = {Langmuir}, keywords = {microparticles, microspheres, optical, pressure, radiation, surface, tir, tirf, totalinternalreflection, trap, tweezers}, number = {7}, pages = {1260--1265}, posted-at = {2007-12-22 23:04:50}, priority = {2}, title = {Measurement of absolute particle-surface separation using total internal reflection microscopy and radiation pressure forces}, url = {http://www.scopus.com/record/display.url?view=extended&origin=resultslist&eid=2-s2.0-0001364472}, volume = {6}, year = {1990} }

TY - JOUR ID - citeulike:2160212 L3 - citeulike-article-id:2160212 N2 - We have previously show how total internal reflection microscopy and radiation pressure forces can be used to study weak interactions between particles and surfaces. The work described here illustrates how we have improved the experiment and extended the technique to measure absolute particle-surface separations as a function of NaCl electrolyte concentration. In so doing, we have shown how the dynamics of particles moving orthogonal to a plane surface can be studied. © 1990 American Chemical Society. IS - 7 JF - Langmuir AD - Unilever Research, Port Sunlight Laboratory, Quarry Road East, Bebington, Wirral, Merseyside L63 3JW, United Kingdom EP - 1265 TI - Measurement of absolute particle-surface separation using total internal reflection microscopy and radiation pressure forces VL - 6 SP - 1260 KW - microparticles KW - microspheres KW - optical KW - pressure KW - radiation KW - surface KW - tir KW - tirf KW - totalinternalreflection KW - trap KW - tweezers AU - Brown, MA AU - Staples, EJ PY - 1990/// UR - http://www.scopus.com/record/display.url?view=extended&origin=resultslist&eid=2-s2.0-0001364472 ER -