Nanometer-displacement detection of optically trapped metallic particles based on critical angle method for small force detection Export

@article{citeulike:2223520, abstract = {\ }, author = {Higurashi, Eiji and Sawada, Renshi and Ito, Takahiro}, citeulike-article-id = {2223520}, citeulike-linkout-0 = {http://scitation.aip.org/getabs/servlet/GetabsServlet?prog=normal&id=RSINAK000070000007003068000001&idtype=cvips&gifs=yes}, citeulike-linkout-1 = {http://link.aip.org/link/?RSI/70/3068}, journal = {Review of Scientific Instruments}, keywords = {angle, angles, angular, critical, detection, displacement, metallic, nanometer, nm, optical, trap, tweezers}, number = {7}, pages = {3068--3073}, posted-at = {2008-01-12 22:11:56}, priority = {2}, publisher = {AIP}, title = {Nanometer-displacement detection of optically trapped metallic particles based on critical angle method for small force detection}, url = {http://scitation.aip.org/getabs/servlet/GetabsServlet?prog=normal&id=RSINAK000070000007003068000001&idtype=cvips&gifs=yes}, volume = {70}, year = {1999} }

TY - JOUR ID - citeulike:2223520 L3 - citeulike-article-id:2223520 N2 -   IS - 7 JF - Review of Scientific Instruments EP - 3073 TI - Nanometer-displacement detection of optically trapped metallic particles based on critical angle method for small force detection PB - AIP VL - 70 SP - 3068 KW - angle KW - angles KW - angular KW - critical KW - detection KW - displacement KW - metallic KW - nanometer KW - nm KW - optical KW - trap KW - tweezers AU - Higurashi, Eiji AU - Sawada, Renshi AU - Ito, Takahiro PY - 1999/// UR - http://scitation.aip.org/getabs/servlet/GetabsServlet?prog=normal&id=RSINAK000070000007003068000001&idtype=cvips&gifs=yes ER -