Curie temperature and critical thickness of ferroelectric thin films Export

@article{citeulike:332394, abstract = {The dynamic Ginzburg\&\#150;Landau theory is applied to establish the critical conditions that control the transition between the paraelectric and ferroelectric states. Analytic expressions of the para-ferroelectric transition temperatures in a thin film under various electromechanical surface conditions are derived via a linear stability analysis of the evolutionary trajectory of the system for both first- and second-order transitions. Explicit expressions are then derived for the critical thickness, below which the thin film is paraelectric for all temperatures. For first-order transitions, the difference between the superheating and supercooling transition temperatures is found to be insensitive to the film thickness and surface boundary conditions. From these expressions, the relative importance on ferroelectricity in thin films due to applied mechanical constraints on the transformation strain and the depolarizing effect of surface charges is discussed and compared with experimental data. \©2005 American Institute of Physics}, author = {Wang, Biao and Woo, C. H.}, citeulike-article-id = {332394}, citeulike-linkout-0 = {http://scitation.aip.org/getabs/servlet/GetabsServlet?prog=normal&id=JAPIAU000097000008084109000001&idtype=cvips&gifs=yes}, citeulike-linkout-1 = {http://link.aip.org/link/?JAP/97/084109}, citeulike-linkout-2 = {http://dx.doi.org/10.1063/1.1861517}, doi = {10.1063/1.1861517}, journal = {Journal of Applied Physics}, keywords = {dynamic, ferroelectric-limit, landau, thin-film}, number = {8}, posted-at = {2005-09-26 11:23:45}, priority = {2}, publisher = {AIP}, title = {Curie temperature and critical thickness of ferroelectric thin films}, url = {http://dx.doi.org/10.1063/1.1861517}, volume = {97}, year = {2005} }

TY - JOUR ID - citeulike:332394 L3 - citeulike-article-id:332394 N2 - The dynamic Ginzburg–Landau theory is applied to establish the critical conditions that control the transition between the paraelectric and ferroelectric states. Analytic expressions of the para-ferroelectric transition temperatures in a thin film under various electromechanical surface conditions are derived via a linear stability analysis of the evolutionary trajectory of the system for both first- and second-order transitions. Explicit expressions are then derived for the critical thickness, below which the thin film is paraelectric for all temperatures. For first-order transitions, the difference between the superheating and supercooling transition temperatures is found to be insensitive to the film thickness and surface boundary conditions. From these expressions, the relative importance on ferroelectricity in thin films due to applied mechanical constraints on the transformation strain and the depolarizing effect of surface charges is discussed and compared with experimental data. ©2005 American Institute of Physics IS - 8 JF - Journal of Applied Physics TI - Curie temperature and critical thickness of ferroelectric thin films PB - AIP VL - 97 KW - dynamic KW - ferroelectric-limit KW - landau KW - thin-film AU - Wang, Biao AU - Woo, CH PY - 2005/// UR - http://dx.doi.org/10.1063/1.1861517 ER -