Blind estimation of general tip shape in AFM imaging Export

@article{citeulike:4455696, abstract = {The use of flared tip and bi-directional servo control in some recent atomic force microscopes (AFM) has made it possible for these advanced AFMs to image structures of general shapes with undercut surfaces. AFM images are distorted representations of sample surfaces due to the dilation produced by the finite size of the tip. It is necessary to obtain the tip shape in order to correct such tip distortion. This paper presents a noise-tolerant approach that can for the first time estimate a general 3-dimensional (3D) tip shape from its scanned image in such AFMs. It extends an existing blind tip estimation method. With the samples, images, and tips described by dexels, a representation that can describe general 3D shapes, the new approach can estimate general tip shapes, including reentrant features such as undercut lines.}, author = {Tian, F. and Qian, X. and Villarrubia, J.}, citeulike-article-id = {4455696}, citeulike-linkout-0 = {http://dx.doi.org/10.1016/j.ultramic.2008.08.002}, citeulike-linkout-1 = {http://linkinghub.elsevier.com/retrieve/pii/S030439910800209X}, doi = {10.1016/j.ultramic.2008.08.002}, issn = {03043991}, journal = {Ultramicroscopy}, keywords = {afm, estimation, image, tip}, month = {December}, number = {1}, pages = {44--53}, posted-at = {2009-05-03 21:47:39}, priority = {2}, title = {Blind estimation of general tip shape in AFM imaging}, url = {http://dx.doi.org/10.1016/j.ultramic.2008.08.002}, volume = {109}, year = {2008} }

TY - JOUR ID - citeulike:4455696 L3 - citeulike-article-id:4455696 N2 - The use of flared tip and bi-directional servo control in some recent atomic force microscopes (AFM) has made it possible for these advanced AFMs to image structures of general shapes with undercut surfaces. AFM images are distorted representations of sample surfaces due to the dilation produced by the finite size of the tip. It is necessary to obtain the tip shape in order to correct such tip distortion. This paper presents a noise-tolerant approach that can for the first time estimate a general 3-dimensional (3D) tip shape from its scanned image in such AFMs. It extends an existing blind tip estimation method. With the samples, images, and tips described by dexels, a representation that can describe general 3D shapes, the new approach can estimate general tip shapes, including reentrant features such as undercut lines. IS - 1 JF - Ultramicroscopy SN - 03043991 EP - 53 TI - Blind estimation of general tip shape in AFM imaging VL - 109 SP - 44 KW - afm KW - estimation KW - image KW - tip AU - Tian, F AU - Qian, X AU - Villarrubia, J PY - 2008/12// UR - http://dx.doi.org/10.1016/j.ultramic.2008.08.002 ER -