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Development of a femtosecond micromachining workstation by use of spectral interferometry.

by: S Bera, AJ Sabbah, CG Durfee, JA Squier
Opt Lett, Vol. 30, No. 4. (15 February 2005), pp. 373-375.


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A workstation that permits real-time measurement of ablation depth while micromachining with femtosecond laser pulses is demonstrated. This method incorporates the unamplified pulse train that is available in a chirped-pulse amplification system as the probe in an arrangement that uses spectral interferometry to measure the ablation depth while cutting with the amplified pulse in thin metal films.


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