Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 20, No. 5. (2002), pp. 1974-1981.
Proceedings of the IEEE, Vol. 85, No. 4. (1997), pp. 486-504.
by Yuan
Taur, DA
Buchanan, Wei
Chen, DJ
Frank, KE
Ismail, Shih-Hsien
Lo, GA
Sai-Halasz, RG
Viswanathan, HJC
Wann, SJ
Wind, Hon-Sum
Wong
Electron Device Letters, IEEE, Vol. 18, No. 12. (1997), pp. 580-582.
Solid-State Electronics, Vol. 38, No. 11. (November 1995), pp. 1975-1977.
Electron Devices, IEEE Transactions on, Vol. 53, No. 6. (2006), pp. 1420-1426.
Journal of Applied Physics, Vol. 51, No. 6. (1980), pp. 3134-3136.
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Vol. 19, No. 3. (2001), pp. 871-877.
Vol. 23, No. 4. (2005), pp. 964-970.
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Vol. 22, No. 4. (2004), pp. 1552-1558.
Electrochemical and Solid-State Letters, Vol. 7, No. 3. (2004), pp. F18-F20.