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these_morel's Frank:DJ [2 articles] Export Sort

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CMOS scaling into the nanometer regime

Proceedings of the IEEE In Proceedings of the IEEE, Vol. 85, No. 4. (06 August 2002), pp. 486-504.

by Yuan Taur, D. A. Buchanan, Wei Chen, et al.D. J. Frank, K. E. Ismail, Shih-Hsien Lo, G. A. Sai-Halasz, R. G. Viswanathan, H. J. C. Wann, S. J. Wind, Hon-Sum Wong

posted to capacitive gate introduction metal by these_morel on 2008-05-20 10:04:37 as

along with 2 people phlip philip-eecs

Device scaling limits of Si MOSFETs and their application dependencies

Proceedings of the IEEE In Proceedings of the IEEE, Vol. 89, No. 3. (2001), pp. 259-288.

by D. J. Frank, R. H. Dennard, E. Nowak, P. M. Solomon, Y. Taur, Hon-Sum P. Wong

posted to introduction microelectronics tunneling by these_morel on 2008-05-15 13:27:43 as

along with 1 person enricaki

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