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these_morel's Lin [5 articles]

Recent papers posted to these_morel's library by the author Lin. You can also see everyone's Lin.
  • Molybdenum metal gate MOS technology for post-SiO<sub>2</sub> gate dielectrics
    Electron Devices Meeting, 2000. IEDM Technical Digest. International (2000), pp. 641-644.
    by Qiang Lu, R Lin, P Ranade, Yee C Yeo, Xiaofan Meng, H Takeuchi, Tsu-Jae King, Chenming Hu, Hongfa Luan, Songjoo Lee, Weiping Bai, Choong-Ho Lee, Dim-Lee Kwong, Xin Guo, Xiewen Wang, Tso-Ping Ma
    posted to dual-metal-gate metal-gate molybdenum nitrogen by these_morel on 2008-05-21 12:01:46 as **
  • Accurate determination of ultrathin gate oxide thickness and effective polysilicon doping of CMOS devices
    Electron Device Letters, IEEE, Vol. 18, No. 12. (1997), pp. 580-582.
    by A Gupta, Peng Fang, M Song, Ming-Ren Lin, D Wollesen, K Chen, C Hu
    posted to introduction microelectronics polydepletion by these_morel on 2008-05-16 12:55:02 as **
  • Thermal decomposition mechanisms of tungsten nitride CVD precursors on Cu(1 1 1)
    Surface Science, Vol. 600, No. 3. (1 February 2006), pp. 743-754.
    by Yaw-Wen Yang, Jin-Bao Wu, Jelin Wang, Yi-Feng Lin, Hsin-Tien Chiu
  • notes Study of the impact of the time-delay effect on the critical dimension of a tungsten silicide/polysilicon gate after reactive ion etching
    The 46th international symposium of the american vacuum society, Vol. 18, No. 4. (2000), pp. 1173-1175.
    by Shih P Lin, Chen H Ou, Szetsen Lee, Yu C Tien, Chin F Hsu
  • Ion-enhanced chemical etching of HfO[sub 2] for integration in metal--oxide--semiconductor field effect transistors
    Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 21, No. 6. (2003), pp. 2420-2427.
    by Lin Sha, Ragesh Puthenkovilakam, You S Lin, Jane P Chang
    posted to dielectric hfo2 high-k by these_morel on 2006-02-21 09:36:28 as ** along with 1 group LTM_LETI_etching
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