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these_morel's Ushiki [1 article]

Recent papers posted to these_morel's library by the author Ushiki. You can also see everyone's Ushiki.
  • Reliable tantalum-gate fully-depleted-SOI MOSFET technology featuring low-temperature processing
    IEEE Transactions on Electron Devices, Vol. 44, No. 9. (1997), pp. 1467-1472.
    by T Ushiki, Mo-Chiun Yu, Y Hirano, H Shimada, M Morita, T Ohmi
    posted to gate introduction metal metal-gate resistivity by these_morel on 2008-05-20 10:02:41 as **
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