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these_morel's effet-de-charge [3 articles]

Recent papers added to these_morel's library classified by the tag effet-de-charge. You can also see everyone's effet-de-charge.
  • Poly-Si/TiN/HfO[sub 2] gate stack etching in high-density plasmas
    Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 25, No. 3. (2007), pp. 767-778.
    posted to effet-de-charge etching poly-si tin xps by these_morel on 2008-03-05 09:03:24 as read
  • notes Prevention method of a notching caused by surface charging in silicon reactive ion etching
    Journal of Micromechanics and Microengineering, Vol. 15, No. 2. (2005), pp. 358-361.
    by Che H Kim, Yong K Kim
  • notes Notching as an example of charging in uniform high density plasmas
    The 3rd International Workshop on Advanced Plasma Tools for Etching, Chemical Vapor Deposition, and Plasma Vapor Deposition: Sources, Process Control, and Diagnostics, Vol. 14, No. 1. (1996), pp. 560-565.
    by Takashi Kinoshita, Masami Hane, James P Mcvittie
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