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these_morel's icp [15 articles]

Recent papers added to these_morel's library classified by the tag icp. You can also see everyone's icp.
  • notes Effect of additive gases on the selective etching of tungsten films using inductively coupled halogen-based plasmas
    Thin Solid Films, Vol. 447-448 (30 January 2004), pp. 586-591.
    by SD Park, YJ Lee, NG Cho, SG Kim, HH Choe, MP Hong, GY Yeom
    posted to tungsten o2 n2 icp cf4-cl2 ar by these_morel on 2008-09-19 09:57:32 as **
  • Highly Anisotropic Etching of Tungsten-Nitride for an X-Ray Mask Absorber with an Inductively Coupled Plasma System
    Japanese Journal of Applied Physics, Vol. 37 (1998), pp. 6819-6823.
    by Hong G Lee, Seung Y Lee, Ho S Moon, Sang H Kim, Joo-Hiuk S Sohn, Jinho Ahn
    posted to etching icp sf6-ar sf6-n2 tungsten-nitride by these_morel on 2008-08-25 12:23:31 as **
  • A simple analysis of an inductive RF discharge
    Plasma Sources Science and Technology, Vol. 1, No. 3. (1992), pp. 179-186.
    posted to dispositifs-experimentaux icp plasma reactor by these_morel on 2008-08-18 12:31:10 as **
  • Application of a low-pressure radio frequency discharge source to polysilicon gate etching
    Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 8, No. 1. (1990), pp. 1-4.
    by JM Cook, DE Ibbotson, DL Flamm
    posted to dispositifs-experimentaux icp plasma reactor by these_morel on 2008-08-18 12:30:18 as **
  • Review of inductively coupled plasmas for plasma processing
    Plasma Sources Science and Technology, Vol. 1, No. 2. (1992), pp. 109-116.
    by J Hopwood
    posted to dispositifs-experimentaux icp plasma reactor by these_morel on 2008-08-18 12:29:26 as **
  • Determination of electromagnetic properties of low-pressure electrodeless inductive discharges
    Journal of Physics D: Applied Physics, Vol. 23, No. 3. (1990), pp. 293-298.
    by JW Denneman
    posted to dispositifs-experimentaux icp plasma reactor by these_morel on 2008-08-18 12:28:16 as **
  • Influence of the reactor wall composition on radicals' densities and total pressure in Cl[sub 2] inductively coupled plasmas: I. Without silicon etching
    Journal of Applied Physics, Vol. 102, No. 9. (2007)
    by G Cunge, N Sadeghi, R Ramos
    posted to absorption cl2 icp plasma xps by these_morel on 2008-03-05 09:16:38 as read
  • notes 30 nm Tungsten gates etched by a low damage ICP etching for the fabrication of compound semiconductor transistors
    Microelectronic Engineering, Vol. 83, No. 4-9. ( 2006), pp. 1152-1154.
    by X Li, X Cao, H Zhou, CDW Wilkinson, S Thoms, D Macintyre, M Holland, IG Thayne
  • CF/sub 4/ decomposition using inductively coupled plasma: effect of power frequency
    Industry Applications, IEEE Transactions on, Vol. 41, No. 1. (2005), pp. 215-220.
    by T Kuroki, J Mine, M Okubo, T Yamamoto, N Saeki
    posted to cf4-o2 decomposition icp by these_morel on 2006-06-19 10:21:45 as read along with 1 group LTM_LETI_etching
  • notes Mass spectrometry studies of resist trimming processes in HBr/O[sub 2] and Cl[sub 2]/O[sub 2] chemistries
    Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 23, No. 1. (2005), pp. 103-112.
    by E Pargon, O Joubert, T Chevolleau, G Cunge, Songlin Xu, Thorsten Lill
  • Selective Etching of HfO2 High-k Gate Material over Si in C4F8/Ar/H2 Plasmas.
    (2004)
    by Kazuo Takahashi, Kouichi Ono
    posted to c4f8-ar-h2 hfo2 high-k icp by these_morel on 2006-03-21 07:41:44 as read along with 1 group LTM_LETI_etching
  • Plasma induced 193-nm Resist Deformation: Problems and a Possible Solution.
    (2004)
  • notes High resolution inductively coupled plasma etching of 30 nm lines and spaces in tungsten and silicon
    Papers from the 44th international conference on electron, ion, and photon beam technology and nanofabrication, Vol. 18, No. 6. (2000), pp. 3471-3475.
    by Andrew L Goodyear, Sinclair Mackenzie, Deirdre L Olynick, Erik H Anderson
  • notes Investigation of etching properties of metal nitride/high-k gate stacks using inductively coupled plasma
    Vol. 23, No. 4. (2005), pp. 964-970.
    by Wan S Hwang, Jinghao Chen, Won J Yoo, Vladimir Bliznetsov
  • notes Effects of Annealing and Ar Ion Bombardment on the Removal of HfO[sub 2] Gate Dielectric
    Electrochemical and Solid-State Letters, Vol. 7, No. 3. (2004), pp. F18-F20.
    by Jinghao Chen, Won J Yoo, Daniel SH Chan, Dim L Kwong
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