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Atomic force microscope cantilever calibration device for quantified force metrology at micro- or nano-scale regime: the nano force calibrator (NFC)

Metrologia, Vol. 43, No. 5. (October 2006), 389.

by Min-Seok Kim, Jae-Hyuk Choi, Yon-Kyu Park, Jong-Ho Kim

posted to spring-constant by tommcdonagh on 2008-09-02 14:04:27 as

along with 2 people ahe r3vi

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tommcdonagh's Park:Y [1 article] Export Sort

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