Accurate determination of the quality factor of axisymmetric resonators by use of a perfectly matched layer

Numerical methods are required to develop an accurate electromagnetic model for various axisymmetric resonators such as micro-discs and micro-toroids. A finite element model for such resonators already exists, however there are number of issues with that model: 1) No perfectly matched layer or any other absorbing boundary conditions are used, 2) Quality factor of a micro-cavity is estimated by running the model multiple times with different boundary conditions, 3) Prior knowledge of the mode frequency is required to implement one of the boundary conditions, and 4) Quality factor of only one mode is estimated at a time. Here our purpose is to overcome the above mentioned drawbacks and determine the quality factor of axisymmetric resonators with high accuracy by using the perfectly matched layer in a finite element model.