To insert individual citation into a bibliography in a word-processor,
select your preferred citation style below and drag-and-drop it into the document.
Applied optics, Vol. 42, No. 10. (1 April 2003), pp. 1839-1846 Key: citeulike:11461461
Formatted Citation
Show HTML
Likes
(beta)
This copy of the article hasn't been liked by anyone yet.
Accurate knowledge of surface emissivity is essential for applications in remote sensing (remote temperature measurement), radiative transport, and modeling of environmental energy balances. Direct measurements of surface emissivity are difficult when there is considerable background radiation at the same wavelength as the emitted radiation. This occurs, for example, when objects at temperatures near room temperature are measured in a terrestrial environment by use ofthe infrared 8-14-microm band.This problem is usually treated by assumption of a perfectly diffuse surface or of diffuse background radiation. However, real surfaces and actual background radiation are not diffuse; therefore there will be a systematic measurement error. It is demonstrated that, in some cases, the deviations from a diffuse behavior lead to large errors in the measured emissivity. Past measurements made with simplifying assumptions should therefore be reevaluated and corrected. Recommendations are presented for improving experimental procedures in emissivity measurement.
CiteULike organises scholarly (or academic) papers or literature and provides bibliographic
(which means it makes bibliographies) for universities and higher education establishments.
It helps undergraduates and postgraduates. People studying for PhDs or in postdoctoral (postdoc) positions.
The service is similar in scope to EndNote or RefWorks or any other reference manager
like BibTeX, but it is a social bookmarking service for scientists and humanities researchers.