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Industrial Informatics, IEEE Transactions on, Vol. 9, No. 1. (February 2013), pp. 122-131, doi:10.1109/tii.2012.2209663 Key: citeulike:11863981
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Solar power has become an attractive alternative of electricity energy. Solar cells that form the basis of a solar power system are mainly based on multicrystalline silicon. A set of solar cells are assembled and interconnected into a large solar module to offer a large amount of electricity power for commercial applications. Many defects in a solar module cannot be visually observed with the conventional CCD imaging system. This paper aims at defect inspection of solar modules in electroluminescence (EL) images. The solar module charged with electrical current will emit infrared light whose intensity will be darker for intrinsic crystal grain boundaries and extrinsic defects including micro-cracks, breaks and finger interruptions. The EL image can distinctly highlight the invisible defects but also create a random inhomogeneous background, which makes the inspection task extremely difficult.
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