Considering process variations during system-level power analysis

@inproceedings{citeulike:1808966, address = {New York, NY, USA}, author = {Chandra, Saumya and Lahiri, Kanishka and Raghunathan, Anand and Dey, Sujit }, booktitle = {ISLPED '06: Proceedings of the 2006 international symposium on Low power electronics and design}, citeulike-article-id = {1808966}, comment = {for the lesson -- nano circuit design}, doi = {10.1145/1165573.1165654}, isbn = {1595934626}, keywords = {circuit, design, nano}, pages = {342--345}, posted-at = {2007-10-23 05:30:02}, priority = {2}, publisher = {ACM Press}, title = {Considering process variations during system-level power analysis}, url = {http://portal.acm.org/citation.cfm?id=1165573.1165654}, year = {2006} }

TY - CONF ID - citeulike:1808966 L3 - citeulike-article-id:1808966 TI - Considering process variations during system-level power analysis T2 - ISLPED '06: Proceedings of the 2006 international symposium on Low power electronics and design SP - 342 EP - 345 AD - New York, NY, USA PB - ACM Press SN - 1595934626 KW - circuit KW - design KW - nano N1 - for the lesson -- nano circuit design AU - Chandra, Saumya AU - Lahiri, Kanishka AU - Raghunathan, Anand AU - Dey, Sujit PY - 2006/// UR - http://portal.acm.org/citation.cfm?id=1165573.1165654 ER -