Direct Sub-Angstrom Imaging of a Crystal Lattice Export

@article{citeulike:6073016, abstract = {Despite the use of electrons with wavelengths of just a few picometers, spatial resolution in a transmission electron microscope (TEM) has been limited by spherical aberration to typically around 0.15 nanometer. Individual atomic columns in a crystalline lattice can therefore only be imaged for a few low-order orientations, limiting the range of defects that can be imaged at atomic resolution. The recent development of spherical aberration correctors for transmission electron microscopy allows this limit to be overcome. We present direct images from an aberration-corrected scanning TEM that resolve a lattice in which the atomic columns are sepa-rated by less than 0.1 nanometer. 10.1126/science.1100965}, author = {Nellist, P. D. and Chisholm, M. F. and Dellby, N. and Krivanek, O. L. and Murfitt, M. F. and Szilagyi, Z. S. and Lupini, A. R. and Borisevich, A. and Sides, W. H. and Pennycook, S. J.}, citeulike-article-id = {6073016}, citeulike-linkout-0 = {http://dx.doi.org/10.1126/science.1100965}, citeulike-linkout-1 = {http://www.sciencemag.org/content/305/5691/1741.abstract}, citeulike-linkout-2 = {http://www.sciencemag.org/content/305/5691/1741.full.pdf}, citeulike-linkout-3 = {http://view.ncbi.nlm.nih.gov/pubmed/15375260}, citeulike-linkout-4 = {http://www.hubmed.org/display.cgi?uids=15375260}, day = {17}, doi = {10.1126/science.1100965}, journal = {Science}, keywords = {dtc, em, project}, month = {September}, number = {5691}, pages = {1741+}, posted-at = {2009-11-05 10:01:17}, priority = {2}, title = {Direct Sub-Angstrom Imaging of a Crystal Lattice}, url = {http://dx.doi.org/10.1126/science.1100965}, volume = {305}, year = {2004} }

TY - JOUR ID - citeulike:6073016 L3 - citeulike-article-id:6073016 N2 - Despite the use of electrons with wavelengths of just a few picometers, spatial resolution in a transmission electron microscope (TEM) has been limited by spherical aberration to typically around 0.15 nanometer. Individual atomic columns in a crystalline lattice can therefore only be imaged for a few low-order orientations, limiting the range of defects that can be imaged at atomic resolution. The recent development of spherical aberration correctors for transmission electron microscopy allows this limit to be overcome. We present direct images from an aberration-corrected scanning TEM that resolve a lattice in which the atomic columns are sepa-rated by less than 0.1 nanometer. 10.1126/science.1100965 IS - 5691 JF - Science TI - Direct Sub-Angstrom Imaging of a Crystal Lattice VL - 305 SP - 1741 KW - dtc KW - em KW - project AU - Nellist, PD AU - Chisholm, MF AU - Dellby, N AU - Krivanek, OL AU - Murfitt, MF AU - Szilagyi, ZS AU - Lupini, AR AU - Borisevich, A AU - Sides, WH AU - Pennycook, SJ PY - 2004/09/17/ UR - http://dx.doi.org/10.1126/science.1100965 ER -